Showing cond-mat.mtrl-sciShow all
2 papers · 1 filter
cond-mat.mtrl-sci2026
Context-Aware Deep Learning for Defect Classification in Atomic-Resolution STEM
Jiadong Dan, Cheng Zhang, Leyi Loh +5
Artificial intelligence is rapidly advancing materials characterization, yet most applications in electron microscopy rely solely on image contrast, overlooking the chemical and ex…
cond-mat.mtrl-sci2024
Symmetry quantification and segmentation in STEM imaging through Zernike moments
Jiadong Dan, Cheng Zhang, Xiaoxu Zhao +1
We present a method using Zernike moments for quantifying rotational and reflectional symmetries in scanning transmission electron microscopy (STEM) images, aimed at improving stru…