2 papers
cs.CV2026
MAOL: Morphology-Aware Ordinal Learning for Fine-Grained Industrial Defect Severity Grading
Zhaoyang Wang, Haiyong Chen, Binyi Su +4
Fine-grained defect severity grading is essential for industrial inspection, yet remains challenging due to the ordinal nature of severity labels, the strong dependence on morpholo…
cs.CV2026
ICME 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for High-Precision Manufacturing
Wei Sun, Weixia Zhang, Linhan Cao +30
This paper presents the IEEE International Conference on Multimedia and Expo (ICME) 2026 Grand Challenge on Cross-Scenario Defect Detection and Fine-Grained Severity Grading for Hi…