O. Tkach

activity

20242026

most citedMulti-Mode Lens for Momentum Microscopy and XPEEM: Theory

8 citations · 16 across the 5 of their papers we have counts for

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3 papers · 1 filter

cond-mat.str-el2025

Layered Multiple Scattering Approach to Hard X-ray Photoelectron Diffraction: Theory and Application

Trung-Phuc Vo, Olena Tkach, Sylvain Tricot +10

Photoelectron diffraction (PED) is a powerful and essential experimental technique for resolving the structure of surfaces with sub-angstrom resolution. In the high energy regime,…

cond-mat.str-el2024

The electronic structure of EuPd $_{2}$ Si $_{2}$ in the vicinity of the critical endpoint

O. Fedchenko, Y. -J. Song, O. Tkach +10

Hard X-ray angle-resolved photoemission spectroscopy reveals significant alterations in the valence band states of EuPd $_{2}$ Si $_{2}$ at a temperature $T_{V}$ , where the Eu ions undergo…

cond-mat.str-el2024

Chirality in the Kagome Metal CsV $_{3}$ Sb $_{5}$

H. J. Elmers, O. Tkach, Y. Lytvynenko +22

Using x-ray photoelectron diffraction (XPD) and angle-resolved photoemission spectroscopy, we study photoemission intensity changes related to changes in the geometric and electron…

Layered Multiple Scattering Approach to Hard X-ray Photoelectron Diffraction: Theory and Application

The electronic structure of EuPd2​Si2​ in the vicinity of the critical endpoint

Chirality in the Kagome Metal CsV3​Sb5​

The electronic structure of EuPd $_{2}$ Si $_{2}$ in the vicinity of the critical endpoint

Chirality in the Kagome Metal CsV $_{3}$ Sb $_{5}$