XCT-SAM: Sequential Parameter-Efficient Domain Adaptation of SAM for Industrial XCT Defect Segmentation

Md Mahedi Hasan, Md Mushfiqur Rahaman, Alan Pachkovskiy +3

Defect segmentation in additive manufacturing (AM) X-ray computed tomography (XCT) images remains challenging due to severe class imbalance and large distribution shifts across sca…