collaborators

1 paper

cond-mat.mtrl-sci2026

Spot Profile Analysis Low Energy Electron Diffraction of Plasma-Enhanced Chemical Vapor Deposition Grown Epitaxial Few-Layer Graphene on Sapphire

Niels Ganser, Marko A. Kriegel, Umut Kaya +6

We demonstrate the use of high-resolution spot-profile analysis low-energy electron diffraction to determine the mean grain size of plasma-enhanced chemical vapor deposition grown…