activity
20072015
most citedUniversal fluctuations in the growth of semiconductor thin films

83 citations · 177 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mes-hall2015★ 7 cited

Permeability and kinetic coefficients for mesoscale BCF surface step dynamics: discrete 2D deposition-diffusion equation analysis

R. Zhao, J. W. Evans, T. J. Oliveira

A discrete version of deposition-diffusion equations appropriate for description of step flow on a vicinal surface is analyzed for a two-dimensional grid of adsorption sites repres…

cond-mat.stat-mech2013★ 83 cited

Universal fluctuations in the growth of semiconductor thin films

R. A. L. Almeida, S. O. Ferreira, T. J. Oliveira +1

Scaling of surface fluctuations of polycrystalline CdTe/Si(100) films grown by hot wall epitaxy are studied. The growth exponent of surface roughness and the dynamic exponent of th…

cond-mat.stat-mech2013★ 25 cited

Scaling in reversible submonolayer deposition

T. J. Oliveira, F. D. A. Aarao Reis

The scaling of island and monomer density, capture zone distributions (CZDs), and island size distributions (ISDs) in reversible submonolayer growth was studied using the Clarke-Vv…

cond-mat.stat-mech2011★ 19 cited

Scaling of island size and capture zone distributions in submonolayer growth

T. J. Oliveira, F. D. A. Aarao Reis

Island size and capture zone distributions (ISDs, CZDs) are studied numerically in submonolayer growth with various critical island sizes and shapes. CZDs scaled by the variance sh…

cond-mat.stat-mech2007★ 20 cited

Maximal and minimal height distributions of fluctuating interfaces

T. J. Oliveira, F. D. A. Aarao Reis

We study numerically the maximal and minimal height distributions (MAHD, MIHD) of the nonlinear interface growth equations of second and fourth order and of related lattice models…

cond-mat.stat-mech2007★ 23 cited

Finite-size effects in roughness distribution scaling

T. J. Oliveira, F. D. A. Aarao Reis

We study numerically finite-size corrections in scaling relations for roughness distributions of various interface growth models. The most common relation, which considers the aver…