2 papers
cs.SE2026
DEFT: Differentiable Automatic Test Pattern Generation
Wei Li, Yang Zou, Yixin Liang +2
Modern IC complexity drives test pattern growth, with the majority of patterns targeting a small set of hard-to-detect (HTD) faults. This motivates new ATPG algorithms to improve t…
cs.LG2025
BRIDGES: Bridging Graph Modality and Large Language Models within EDA Tasks
Wei Li, Yang Zou, Christopher Ellis +3
While many EDA tasks already involve graph-based data, existing LLMs in EDA primarily either represent graphs as sequential text, or simply ignore graph-structured data that might…