141 citations · 243 across the 8 of their papers we have counts for
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cond-mat.soft2019
Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks
Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis +6
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple a…
physics.app-ph2019★ 38 cited
Absolute Seebeck coefficient of thin platinum films
M. Kockert, R. Mitdank, A. Zykov +2
The influence of size effects on the thermoelectric properties of thin platinum films is investigated and compared to the bulk. Structural properties, like the film thickness and t…