141 citations · 243 across the 8 of their papers we have counts for
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cond-mat.soft2019
Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks
Alessandro Greco, Vladimir Starostin, Christos Karapanagiotis +6
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. In this study, we show how a simple a…
cond-mat.soft2007★ 141 cited
Optical Properties of Pentacene and Perfluoropentacene Thin Films
Alexander Hinderhofer, Ute Heinemeyer, Alexander Gerlach +5
The optical properties of pentacene (PEN) and perfluoropentacene(PFP) thin films on various SiO2 substrates were studied using variable angle spectroscopic ellipsometry. Structural…