activity
20212026
most citedMulti-scale plasticity homogenization of Sn-3Ag-0.5Cu: from β-Sn micropillars to polycrystals with intermetallics

16 citations · 41 across the 11 of their papers we have counts for

collaborators

11 papers

cond-mat.mtrl-sci2026

EBSD and Subtle Crystallographic Differences - A Study of Resolving Interlayer Spacings in Nb-Ni and Nb-Co mu-phases

Lukas Berners, Nisa Ulumuddin, Annika Baum +9

In ordered intermetallics, slight variations in lattice site occupancy and specific interlayer spacings have been identified as the sources of significant changes in critical resol…

cond-mat.mtrl-sci2026

Characterizing Dislocation Substructures in Creep-Deformed Olivine Using Electron Channeling Contrast Imaging

M. Haroon Qaiser, Jessica White, David Wallis +1

Olivine is the dominant mineral in Earth's upper mantle and therefore controls mantle rheology and the mechanics of plate tectonics. The constitutive laws for dislocation-mediated…

cond-mat.mtrl-sci2026

Dynamical Simulation of On-axis Transmission Kikuchi and Spot Diffraction Patterns, Based on Accurate Diffraction Geometry Calibration

Tianbi Zhang, Raynald Gauvin, Aimo Winkelmann +1

Transmission Kikuchi diffraction in the scanning electron microscope has gained popularity as a materials characterization technique for its high throughput and nanometer-level spa…

cond-mat.mtrl-sci2024

Improved understanding of the growth of blocky alpha in welded Zircaloy-4

Ruth M. Birch, T. Ben Britton

Zirconium alloys are widely used in nuclear reactors as fuel cladding materials. Fuel cladding is used to contain the nuclear fuel and cladding tubes are typically sealed using wel…

cond-mat.mtrl-sci2023★ 5 cited

A simple, static and stage mounted direct electron detector based electron backscatter diffraction system

Tianbi Zhang, T. Ben Britton

To engineer the next generation of advanced materials we must understand their microstructure, and this requires microstructural characterization. This can be achieved through the…

cond-mat.mtrl-sci2023★ 7 cited

Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors

Tianbi Zhang, T. Ben Britton

Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materia…

cond-mat.mtrl-sci2023

Characterization of local deformation around hydrides in Zircaloy-4 using conventional and high angular resolution electron backscatter diffraction

Ruth M. Birch, James O. Douglas, T. Ben Britton

Zircaloy-4 is used as a fuel cladding material for water reactors, as it has good mechanical properties, corrosion resistance, and a low thermal neutron absorption cross section. H…

cond-mat.mtrl-sci2023★ 12 cited

Transmission Kikuchi diffraction mapping induces structural damage in atom probe specimens

Baptiste Gault, Heena Khanchandani, T. S. Prithiv +2

Measuring local chemistry of specific crystallographic features by atom probe tomography (APT) is facilitated by using transmission Kikuchi diffraction (TKD) to help position them…

cond-mat.mtrl-sci2022★ 16 cited

Multi-scale plasticity homogenization of Sn-3Ag-0.5Cu: from β-Sn micropillars to polycrystals with intermetallics

Yilun Xu, Tianhong Gu, Jingwei Xian +4

The mechanical properties of -Sn single crystals have been systematically investigated using a combined methodology of micropillar tests and rate-dependent crystal plasticity mo…

cond-mat.mtrl-sci2022

Optimizing broad ion beam polishing of zircaloy-4 for electron backscatter diffraction analysis

Ning Fang, Ruth Birch, T. Ben Britton

Microstructural analysis with electron backscatter diffraction (EBSD) involves sectioning and polishing to create a flat and preparation-artifact free surface. The quality of EBSD…

cond-mat.mtrl-sci2021★ 1 cited

Accessing slip activity in high purity tin with electron backscatter diffraction and measurement of slip strength

Tianhong Gu, Finn Giuliani, T. Ben Britton

Beta-tin has been used widely as an interconnect in modern electronics. To improve the understanding of the reliability of these components, we directly measure the critical resolv…