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cs.CV2026
ScratchSim: A Procedural Synthetic Data Pipeline for Surface Scratch Detection
Paul Julius Kühn, Saptarshi Neil Sinha, Tiago Kleist +3
While automated defect detection such as the detection of surface scratched is an important aspect in industrial quality control, the scarcity of annotated defect data make this ta…
cs.CV2026
A Human-in-the-Loop Deep Learning Framework for Color Reconstruction of Lenticular Films
Saptarshi Neil Sinha, Tiago Kleist, Giorgio Trumpy
Historical lenticular films, such as those created with the Kodacolor process, encode color information in a distinctive spatial format. This structure requires specialized techniq…