3 papers
cs.CV2026
Morphology-Aware Ambiguity Learning for Wafer Defect Decision Support
Seungjun Chu, Seokhyun Chung
Wafer map defect recognition is commonly formulated as a fixed-taxonomy classification problem that assigns each wafer to a single defect class. However, some wafers exhibit morpho…
cs.CV2026
CDGP: Contrastive Dual Gaussian Processes for Weakly Supervised Anomaly Segmentation
Seungjun Chu, Seokhee Han, Mateusz Nowak +1
Industrial visual inspection must both decide whether a product is defective and localize the defect, yet pixel-level masks are costly to collect at scale. Most anomaly-segmentatio…
cs.CV2026
SPARC: Subspace Position-Aware Robust Few-Shot Calibration for Distribution-Shifted Industrial Anomaly Detection
Seokhee Han, Seungjun Chu, Mateusz Nowak +1
Vision-based industrial anomaly detectors are calibrated on one distribution but may be deployed on another that differs in illumination, fixture placement, or sensor characteristi…