49 citations · 66 across the 8 of their papers we have counts for
4 papers · 1 filter
Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy
Maxime Le Ster, Sławomir Pawłowski, Iaroslav Lutsyk +1
Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, w…
Moiré plane wave expansion model for scanning tunneling microscopy simulations of incommensurate two-dimensional materials
Maxime Le Ster, Paweł Dabrowski, Paweł Krukowski +8
Incommensurate heterostructures of two-dimensional (2D) materials, despite their attractive electronic behaviour, are challenging to simulate because of the absence of translation…
Graphene on quartz modified with rhenium oxide as a semitransparent electrode for organic electronic
Paweł Krukowski, Michał Piskorski, Ruslana Udovytska +19
Our research shows that commercially available graphene on quartz modified with rhenium oxide meets the requirements for its use as a conductive and transparent anode in optoelectr…
Influence of Structural Defects on Charge Density Waves in 1T-TaS2
I. Lutsyk, K. Szalowski, P. Krukowski +22
The influence of intrinsic defects of 1T-TaS2 on charge density waves (CDW) is studied using scanning tunneling microscopy and spectroscopy (STM, STS), angle-resolved photoelectron…