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20172026
most citedEngineering Multiple Topological Phases in Nanoscale Van der Waals Heterostructures: Realisation of -Antimonene

49 citations · 66 across the 8 of their papers we have counts for

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physics.ins-det2023★ 5 cited

Fourier Transform-Based Post-Processing Drift Compensation and Calibration Method for Scanning Probe Microscopy

Maxime Le Ster, Sławomir Pawłowski, Iaroslav Lutsyk +1

Scanning probe microscopy (SPM) is ubiquitous in nanoscale science allowing the observation of features in real space down to the angstrom resolution. The scanning nature of SPM, w…