2 papers
cs.AR2026
HOLMES: In-Context Failure-Center Localization for High-Dimensional Yield Estimation
Wei W. Xing, Xixi Zhou, Kaiqi Huang +4
Importance sampling for high-sigma yield estimation requires locating the failure center from a severely imbalanced sample set. Existing surrogate-assisted methods rely on iterativ…
cs.LG2026
Breaking the Tuning Barrier: Zero-Hyperparameters Yield Multi-Corner Analysis Via Learned Priors
Wei W. Xing, Kaiqi Huang, Jiazhan Liu +2
Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of where denotes cor…