2 papers
cond-mat.mtrl-sci2026
Real-space overlap is not enough: ambiguity in nanobeam iterative ptychography
Stephanie M. Ribet, Mohsen Danaie, Willem P. M. de Kleijne +5
High-resolution iterative ptychography typically relies on a well-aligned, high-convergence-angle electron probe. Here we explore whether it can instead be performed at small conve…
physics.ins-det2026
An Interactive, Automated 4D-STEM data acquisition and analysis routine for Scanning Electron Nanobeam Diffraction and Ptychography experiments
Mohsen Danaie, Max England, Yiming Xu +11
Modern transmission electron microscopes are versatile instruments which have become indispensable tools for understanding structure and chemical composition at the nano- and atomi…