Trap Dynamics and Conductivity Changes in AlGaN/GaN Heterostructures Under Ultrasonic Loading

Vladyslav Kaliuzhnyi, Mykola Tymochko, Oleksandr Gudymenko +2

AlGaN/GaN heterostructures are critical for high-power electronic devices but suffer from electron trapping at defects, limiting reliability. We investigate how ultrasonic vibratio…