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eess.IV2020
Fast reconstruction of atomic-scale STEM-EELS images from sparse sampling
Etienne Monier, Thomas Oberlin, Nathalie Brun +3
This paper discusses the reconstruction of partially sampled spectrum-images to accelerate the acquisition in scanning transmission electron microscopy (STEM). The problem of image…
eess.IV2018
Reconstruction of partially sampled multi-band images - Application to STEM-EELS imaging
Étienne Monier, Thomas Oberlin, Nathalie Brun +3
Electron microscopy has shown to be a very powerful tool to map the chemical nature of samples at various scales down to atomic resolution. However, many samples can not be analyze…