2 papers
cond-mat.mes-hall2026
iDART: Interferometric Dual-AC Resonance Tracking nano-electromechanical mapping
J. Bemis, F. Wunderwald, U. Schroeder +3
Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechan…
cond-mat.mtrl-sci2024
Long-term stability and oxidation of ferroelectric AlScN devices: An operando HAXPES study
Oliver Rehm, Lutz Baumgarten, Roberto Guido +6
Aluminum scandium nitride (AlScN) is a promising material for ferroelectric devices due to its large remanent polarization, scalability, and compatibility with semicond…