2 papers
cond-mat.mes-hall2026
High Speed Contact-Resonance Tracking using Brownian motion
J. Bemis, R. Proksch
Contact-resonance atomic force microscopy (CR-AFM) provides nanoscale maps of contact stiffness, dissipation, and electromechanical response, but conventional piezoacoustic excitat…
cond-mat.mes-hall2026
iDART: Interferometric Dual-AC Resonance Tracking nano-electromechanical mapping
J. Bemis, F. Wunderwald, U. Schroeder +3
Piezoresponse force microscopy (PFM) has established itself as a very successful and reliable imaging and spectroscopic tool for measuring a wide variety of nanoscale electromechan…