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quant-ph2026
Predicting electric-field noise in ion traps using fluctuation electrodynamics
Markus Teller, Da An, Alberto M. Alonso +4
Electric-field noise in microfabricated surface ion traps contributes to gate errors in trapped-ion quantum computers, but this noise has been challenging to predict. Here, we pres…
quant-ph2026
Minimization of micromotion for nanoparticles in a Paul trap
Jamie Morley, Jean Paul Louys Sansó, Dmitry Bykov +2
When a charged particle in a Paul trap is displaced from the node of the AC trapping field, excess micromotion arises as an undesired effect. Excess micromotion heats the particle,…