activity
20082011
most citedBarrier Lowering and Backscattering Extraction in Short-Channel MOSFETs

16 citations · 42 across the 6 of their papers we have counts for

collaborators

6 papers

cond-mat.mes-hall2011★ 6 cited

A Backscattering Model Incorporating the Effective Carrier Temperature in Nano MOSFET

Gino Giusi, Giuseppe Iannaccone, Felice Crupi +1

In this work we propose a channel backscattering model in which increased carrier temperature at the top of the potential energy barrier in the channel is taken into account. This…

cond-mat.mes-hall2010★ 4 cited

Criticisms on and Comparison of Experimental Channel Backscattering Extraction Methods

Gino Giusi, Felice Crupi, Paolo Magnone

In this paper we critically review and compare experimental methods, based on the Lundstrom model, to extract the channel backscattering ratio in nano MOSFETs. Basically two experi…

cond-mat.mes-hall2010★ 16 cited

Barrier Lowering and Backscattering Extraction in Short-Channel MOSFETs

Gino Giusi, Giuseppe Iannaccone, Debrabata Maji +1

In this work we propose a fully experimental method to extract the barrier lowering in short-channel saturated MOSFETs using the Lundstrom backscattering transport model in a one s…

cond-mat.mes-hall2010★ 9 cited

A microscopically accurate model of partially ballistic nanoMOSFETs in saturation based on channel backscattering

Gino Giusi, Giuseppe Iannaccone, Felice Crupi

We propose a model for partially ballistic MOSFETs and for channel backscattering that is alternative to the well known Lundstrom model and is more accurate from the point of view…

cond-mat.mes-hall2008★ 1 cited

Transient Analysis of Warm Electron Injection Programming of Double Gate SONOS Memories by means of Full Band Monte Carlo Simulation

G. Giusi, G. Iannaccone, U. Ravaioli

In this paper we investigate "Warm Electron Injection" as a mechanism for NOR programming of double-gate SONOS memories through 2D full band Monte Carlo simulations. Warm electron…

cond-mat.mes-hall2008★ 6 cited

Study of Warm Electron Injection in Double Gate SONOS by Full Band Monte Carlo Simulation

G. Giusi, G. Iannaccone, M. Mohamed +1

In this paper we investigate warm electron injection in a double gate SONOS memory by means of 2D full-band Monte Carlo simulations of the Boltzmann Transport Equation (BTE). Elect…