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physics.optics2013
Nanolayer thickness detection via spatial mode projection
N. Hermosa, C. Rosales-Guzmán, S. F. Pereira +1
We demonstrate an optical scheme for measuring the thickness of thin nanolayers with the use of light beam s spatial modes. The novelty in our scheme is the projection of the beam…
physics.optics2008
Focused Fields of given Power with Maximum Electric Field Components
H. P. Urbach S. F. Pereira
Closed formulas are derived for the field in the focal region of a diffraction limited lens, such that the electric field component in a given direction at the focal point is large…