most citedExperimental and computational diffusion analysis in Ni-X binary and Ni-Al-X (X = Cr, Mo, Ta, W, Re) ternary systems

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cond-mat.mtrl-sci2026★ 1 cited

Experimental and computational diffusion analysis in Ni-X binary and Ni-Al-X (X = Cr, Mo, Ta, W, Re) ternary systems

Ankur Srivastava, Suman Sadhu, Satyam Kumar +5

An extensive diffusion analysis is presented for binary Ni-X and ternary Ni-Al-X (X = Cr, Mo, Ta, W, Re) systems, which play a crucial role in microstructural evolution and phase s…

cond-mat.mtrl-sci2024

Data-efficient 4D-STEM in SEM: Beyond 2D Materials to Metallic Materials

Ujjval Bansal, Amit Sharma, Barbara Putz +2

Four-dimensional scanning transmission electron microscopy (4D-STEM) is a powerful tool that allows for the simultaneous acquisition of spatial and diffraction information, driven…