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20082022
most citedRoom temperature magnetic order on zigzag edges of narrow graphene nanoribbons

813 citations · 2.7k across the 23 of their papers we have counts for

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cond-mat.mes-hall2008★ 606 cited

Anomalies in thickness measurements of graphene and few layer graphite crystals by tapping mode atomic force microscopy

P. Nemes-Incze, Z. Osvath, K. Kamaras +1

Atomic Force Microscopy (AFM) in the tapping (intermittent contact) mode is a commonly used tool to measure the thickness of graphene and few layer graphene (FLG) flakes on silicon…