220 citations · 648 across the 20 of their papers we have counts for
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physics.optics2021★ 6 cited
Defocused travelling-fringes in scanning triple-Laue x-ray interferometry
Carlo P. Sasso, Giovanni Mana, Enrico Massa
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the meas…
physics.ins-det2021★ 4 cited
Measurement of the miscut angle in the determination of the Si lattice parameter
Carlo P. Sasso, Giovanni Mana, Enrico Massa
The measurement of the angle between the interferometer front mirror and the diffracting planes is a critical aspect of the Si lattice-parameter measurement by combined x-ray and o…