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physics.optics2021★ 6 cited
Defocused travelling-fringes in scanning triple-Laue x-ray interferometry
Carlo P. Sasso, Giovanni Mana, Enrico Massa
The measurement of the silicon lattice parameter by a separate-crystal triple-Laue x-ray interferometer is a key step for the kilogram realisation by counting atoms. Since the meas…
physics.optics2015★ 7 cited
Diffraction effects in length measurements by laser interferometry
Carlo Paolo Sasso, Enrico Massa, Giovanni Mana
High-accuracy dimensional measurements by laser interferometers require corrections because of diffraction, which makes the effective fringe-period different from the wavelength of…