10 citations · 10 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2024
Tracking solid oxide cell electrode microstructural evolution during annealing by scanning 3D X-ray diffraction microscopy
A. Shukla, S. De Angelis, J. Wright +4
Ni particle coarsening is a primary degradation mechanism in Ni/YSZ solid oxide cells, limiting the lifespan of these devices. In this study, we demonstrate the use of Scanning 3D…
cond-mat.mtrl-sci2024★ 10 cited
Grain boundary strain localization in CdTe solar cell revealed by Scanning 3D X-ray diffraction microscopy
A. Shukla, J. Wright, A. Henningsson +8
Cadmium Telluride (CdTe) solar cell technology is a promising candidate to help boost green energy production. However, impurities and structural defects are major barriers to impr…