11 citations · 12 across the 4 of their papers we have counts for
4 papers
Nanostructures for in-situ surface-enhanced Kretschmann-Raether ellipsometry
Deshabrato Mukherjee, Benjamin Kalas, Sven Burger +4
Spectroscopic ellipsometry is a sensitive and optical model-supported quantitative tool to monitor interfaces. In this work, solid-liquid interfaces are studied using the Kretschma…
Structural modifications induced in hydrogenated amorphous Si/Ge multilayers by heat treatments
C. Frigeri, M. Serenyi, A. Csik +3
A study is presented of the structural changes occurring as a function of the annealing conditions in hydrogenated amorphous Si/Ge multilayers prepared by sputtering. Annealing cha…
AFM and TEM study of hydrogenated sputtered Si/Ge multilayers
C. Frigeri, L. Nasi, M. Serenyi +3
Multilayers of hydrogenated ultrathin (3 nm) amorphous a-Si and a-Ge layers prepared by sputtering have been studied by atomic force microscopy (AFM) and transmission electron micr…
Investigation of thermal stability of hydrogenated amorphous Si/Ge multilayers
A. Csik, M. Serenyi, Z. Erdelyi +6
Thermal stability of hydrogenated amorphous Si/Ge multilayers has been investigated by Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM) and Small-Angle X-…