2 papers
cs.LG2026
Diffuse to Detect: Generative Diffusion Models for Unsupervised IC Anomaly Detection
Yuxuan Yin, Chen He, Todd Jacobs +4
Latent defect screening is challenged by extremely low failure rates, high-dimensional test data, and absence of labeled anomalies. We propose the first unsupervised anomaly detect…
cs.LG2025
Transfer Learning for Minimum Operating Voltage Prediction in Advanced Technology Nodes: Leveraging Legacy Data and Silicon Odometer Sensing
Yuxuan Yin, Rebecca Chen, Boxun Xu +2
Accurate prediction of chip performance is critical for ensuring energy efficiency and reliability in semiconductor manufacturing. However, developing minimum operating voltage ($V…