Cr/p-HgCdTe (x = 0.28, 1.0) contact resistance and I-V characteristics in the LTLM configuration

F. Sizov, A. Zinovchuk, V. Slipokurov +2

The specific contact resistance ${\rho }_c$ of Cr/p-Hg${}_{0.72}$Cd${}_{0.28}$Te and Cr/p-CdTe/p-Hg${}_{0.72}$Cd${}_{0.28}$Te heterointerfaces, which were formed by deposition of Cr films at roo…