most citedFrom Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification

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cs.AR2025★ 2 cited

From Concept to Practice: an Automated LLM-aided UVM Machine for RTL Verification

Junhao Ye, Yuchen Hu, Ke Xu +8

Verification presents a major bottleneck in Integrated Circuit (IC) development, consuming nearly 70% of the total development effort. While the Universal Verification Methodology…