Thickness-dependent degradation and optical access in epitaxial 2H-MoTe2 protected by metallic capping layers

Wojciech Ryś, Iaroslav Lutsyk, Michał Piskorski +13

We investigate degradation and surface protection of epitaxial 2H-MoTe2 films grown by molecular beam epitaxy on GaAs(111)B substrates. Using X-ray photoelectron spectroscopy (XPS)…