X-ray observations of highly obscured 9.7 micron sources: an efficient method for selecting Compton-thick AGN ?

I. Georgantopoulos, K. M. Dasyra, E. Rovilos +8

Spitzer/IRS has revealed many sources with very deep Si features at 9.7micron (tau>1). We set out to investigate whether a strong Si absorption feature is a good indicator for the…