collaborators

9 papers

cs.AR2026

FT-Pilot: Automated Fault-Tolerant RTL Rewriting via Vulnerability-Guided LLMs

Weixing Liu, Zizhen Liu, Jing Ye +4

As integrated circuit technologies continue to scale toward advanced process nodes, the continual reduction in node capacitance and supply voltage has made digital systems increasi…

cs.SE2026

Debug Like a Human: Scaling LLM-based Fault Localization to Processor Design via Block-Level Instruction-Oriented Slicing

Zizhen Liu, Xiaoguang Mao, Deheng Yang +6

Fault localization in modern processor design code is a critical yet time-consuming step during processor verification. While recent advances in LLM-based techniques for module-lev…

cs.CR2026

On the Vulnerability of FHE Computation to Silent Data Corruption

Jianan Mu, Ge Yu, Zhaoxuan Kan +6

Fully Homomorphic Encryption (FHE) is rapidly emerging as a promising foundation for privacy-preserving cloud services, enabling computation directly on encrypted data. As FHE impl…

cs.AR2026

Lifecycle Cost-Effectiveness Modeling for Redundancy-Enhanced Multi-Chiplet Architectures

Zizhen Liu, Fangzhiyi Wang, Mengdi Wang +4

The growing demand for compute-intensive applications has made multi-chiplet architectures a promising alternative to monolithic designs, offering improved scalability and manufact…

cs.AR2025

Analysis of LLM Vulnerability to GPU Soft Errors: An Instruction-Level Fault Injection Study

Duo Chai, Zizhen Liu, Shuhuai Wang +4

Large language models (LLMs) are highly compute- and memory-intensive, posing significant demands on high-performance GPUs. At the same time, advances in GPU technology driven by s…

cs.AR2025

InF-ATPG: Intelligent FFR-Driven ATPG with Advanced Circuit Representation Guided Reinforcement Learning

Bin Sun, Rengang Zhang, Zhiteng Chao +4

Automatic test pattern generation (ATPG) is a crucial process in integrated circuit (IC) design and testing, responsible for efficiently generating test patterns. As semiconductor…