2 papers
quant-ph2026
Quantum Limits of Passive Optical Surface Metrology and Defect Detection
Jernej Frank, George Brumpton, Tommaso Tufarelli +2
We develop a quantum statistical framework for passive optical surface metrology. Modelling a surface as an incoherent ensemble of point emitters imaged through a diffraction-limit…
physics.optics2024
Tsang's resolution enhancement method for imaging with focused illumination
Alexander Duplinskiy, Jernej Frank, Kaden Bearne +1
A widely tested approach to overcoming the diffraction limit in microscopy without disturbing the sample relies on substituting widefield sample illumination with a structured ligh…