4 papers · 1 filter
Precision Specimen Positioning in Electron Microscopy through Hysteresis Compensation, Iterative Learning, and Vision-Based Sensing
J. S. van Hulst, A. M. C. de Peffer, D. Herceg +4
Electron microscopy requires nanometer-scale specimen positioning over a long stroke. Piezo-stepper actuators are well suited for this task, but their accuracy is limited by hyster…
Estimating Evolving Functions with Dynamic Gaussian Processes
J. S. van Hulst, W. P. M. H. Heemels, D. J. Antunes
This paper develops the Dynamic Gaussian Process (DGP), a framework for estimating functions governed by integro-difference equations (IDEs). IDEs model continuous functions that e…
Tilt-based Aberration Estimation in Transmission Electron Microscopy
Jilles S. van Hulst, Erik M. Franken, Bart J. Janssen +2
Transmission electron microscopes (TEMs) enable atomic-scale imaging but suffer from aberrations caused by lens imperfections and environmental conditions, reducing image quality.…
Estimation of Dynamic Gaussian Processes
Jilles van Hulst, Roy van Zuijlen, Duarte Antunes +2
Gaussian processes provide a compact representation for modeling and estimating an unknown function, that can be updated as new measurements of the function are obtained. This pape…