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Two-dimensional transition metal dichalcogenides under electron irradiation: defect production and doping
Hannu-Pekka Komsa, Jani Kotakoski, Simon Kurasch +3
Using first-principles atomistic simulations, we study the response of atomically-thin layers of transition metal dichalcogenides (TMDs) - a new class of two-dimensional inorganic…
The application of Graphene as a sample support in Transmission Electron Microscopy
R. S. Pantelic, J. C. Meyer, U. Kaiser +1
Transmission electron microscopy has witnessed rampant development and surging point resolution over the past few years. The improved imaging performance of modern electron microsc…
An accurate measurement of electron beam induced displacement cross sections for single-layer graphene
J. C. Meyer, F. Eder, S. Kurasch +9
We present an accurate measurement and a quantitative analysis of electron-beam induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displ…
Atomic-scale effects behind structural instabilities in Si lamellae during ion beam thinning
Eero Holmström, Jani Kotakoski, Lorenz Lechner +2
The rise of nanotechnology has created an ever-increasing need to probe structures on the atomic scale, to which transmission electron microscopy has largely been the answer. Curre…