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20242026
most citedDifferentiable Microscopy Designs an All Optical Phase Retrieval Microscope

3 citations · 3 across the 6 of their papers we have counts for

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physics.optics2026

High-Sensitivity, High-Throughput Double Sagnac Lateral Shearing Quantitative Phase Microscopy and Tomography with Pseudo-Thermal Illumination

Pawel Goclowski, Maciej Trusiak, Balpreet S. Ahluwalia +1

Quantitative phase microscopy (QPM) enables label-free measurement of local optical path length variations, providing critical insight into the structure and dynamics of transparen…

physics.optics2026

Lateral shearing optical diffraction tomography of brain organoid with reduced spatial coherence

Pawel Goclowski, Julianna Winnik, Vishesh Dubey +6

Optical diffraction tomography (ODT) is a powerful technique for quantitative, label-free reconstruction of the three-dimensional refractive index (RI) distribution of biological s…

physics.optics2026

High-Fidelity Single-Shot Quantitative Differential Phase Microscopy Using Pseudothermal Sagnac Interferometer

Pawel Goclowski, Hong Mao, Maciek Trusiak +2

In this letter, a high-fidelity single-shot differential quantitative phase microscopy (dQPM) method is presented to effectively image nearly transparent biological samples. The pr…

physics.optics20263 cited

Differentiable Microscopy Designs an All Optical Phase Retrieval Microscope

Kithmini Herath, Hasindu Kariyawasam, Ramith Hettiarachchi +7

Designing new optical systems from the ground up for microscopy imaging tasks such as phase retrieval, requires substantial scientific expertise and creativity. To augment the trad…

physics.optics2026

Piezoelectric MEMS Phase Modulator for Silicon Nitride Platform in the Visible Spectrum

Firehun T. Dullo, Paul C. Thrane, Nikhil Jayakumar +4

Active photonic integrated circuits (PICs) in the visible spectrum are essential for on-chip applications, requiring low-loss waveguides with broad transparency and efficient, low-…

physics.optics2025

Bayesian inference for precise and uncertainty-quantified single-shot widefield interferometric geometrical nanometrology

Damian Suski, Maria Cywinska, Julianna Winnik +5

Advanced geometrical nanometrology is critical for process control in semiconductor manufacturing, supporting applications in, e.g., photonic integrated circuits, nanoelectronics,…