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cond-mat.mtrl-sci2021
Laser-assisted atom probe tomography of c-plane and m-plane InGaN test structures
N. A. Sanford, P. T. Blanchard, M. D. Brubaker +6
Laser-assisted atom probe tomography (APT) was used to measure the indium mole fraction x of c-plane, MOCVD-grown, GaN/In(x)Ga(1-x)N/GaN test structures and the results were compar…
cond-mat.mtrl-sci2017★ 1 cited
Thermal boundary conductance across epitaxial ZnO/GaN interfaces: Assessment of phonon gas models and atomistic Green's function approaches for predicting interfacial phonon transport
John T. Gaskins, George Kotsonis, Ashutosh Giri +13
We present experimental measurements of the thermal boundary conductance (TBC) from K across isolated heteroepitaxially grown ZnO films on GaN substrates. These data pro…