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cond-mat.mtrl-sci2003

Annealing-Dependent Magnetic Depth Profile in Ga[1-x]Mn[x]As

B. J. Kirby, J. A. Borchers, J. J. Rhyne +7

We have studied the depth-dependent magnetic and structural properties of as-grown and optimally annealed Ga[1-x]Mn[x]As films using polarized neutron reflectometry. In addition to…