most citedLocalization effects in the disordered Ta interlayer of multilayer Ta-FeNi films: Evidence from dc transport and spectroscopic ellipsometry study

10 citations · 16 across the 2 of their papers we have counts for

collaborators

2 papers

cond-mat.mtrl-sci2023★ 6 cited

Bismuth layer properties in the ultrathin Bi-FeNi multilayer films probed by spectroscopic ellipsometry

N. N. Kovaleva, D. Chvostova, O. Pacherova +6

Using wide-band (0.5-6.5 eV) spectroscopic ellipsometry we study ultrathin [Bi(0.6-2.5 nm)-FeNi(0.8,1.2 nm)]N multilayer films grown by rf sputtering deposition, where the FeNi lay…

cond-mat.str-el2021★ 10 cited

Localization effects in the disordered Ta interlayer of multilayer Ta-FeNi films: Evidence from dc transport and spectroscopic ellipsometry study

N. N. Kovaleva, D. Chvostova, O. Pacherova +4

Using dc transport and wide-band spectroscopic ellipsometry techniques, we study localization effects in the disordered metallic Ta interlayer of different thickness in the multila…