2 papers
cs.CV2026
Improving Combined Detection and Classification of TEM Defects via Mask-Conditioned Latent Diffusion Augmentation
Ni Li, Nuohao Liu, Ryan Jacobs +5
Analyzing microstructural defects in transmission electron microscopy (TEM) images, particularly in irradiated metal alloys, is often limited by the availability of high-quality, l…
cs.CV2025
Predicting Performance of Object Detection Models in Electron Microscopy Using Random Forests
Ni Li, Ryan Jacobs, Matthew Lynch +3
Quantifying prediction uncertainty when applying object detection models to new, unlabeled datasets is critical in applied machine learning. This study introduces an approach to es…