most citedDependence of Electrostatic Patch Force Evaluation on the Lateral Resolution of Kelvin Probe Force Microscopy

3 citations · 3 across the 1 of their papers we have counts for

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cond-mat.mes-hall2024★ 3 cited

Dependence of Electrostatic Patch Force Evaluation on the Lateral Resolution of Kelvin Probe Force Microscopy

Kun Shi, Pengshun Luo, Jinquan Liu +2

Kelvin Probe Force Microscopy (KPFM) is widely used to measure the surface potential on samples, from which electrostatic patch force can be calculated. However, since the KPFM mea…