most citedRelative Time-of-Flight Measurement in an Ultrafast Electron Microscope

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Relative Time-of-Flight Measurement in an Ultrafast Electron Microscope

Jialiang Chen, Simon A. Willis, David J. Flannigan

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond (fs) laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit f…

cond-mat.mtrl-sci2024

Wehnelt Photoemission in an Ultrafast Electron Microscope: Stability and Usability

Simon A. Willis, Wyatt A. Curtis, David J. Flannigan

We tested and compared the stability and usability of three different cathode materials and configurations in a thermionic-based ultrafast electron microscope: (1) on-axis thermion…