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most citedEnhancing Gate Control and Mitigating Short Channel Effects in 20-50 nm Channel Length Amorphous Oxide Thin Film Transistors

7 citations · 10 across the 3 of their papers we have counts for

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cond-mat.mtrl-sci2024★ 3 cited

Probing Charge Dynamics in Amorphous Oxide Semiconductors by Time-of-flight Microwave Impedance Microscopy

Jia Yu, Yuchen Zhou, Xiao Wang +3

The unique electronic properties of amorphous indium gallium zinc oxide (a-IGZO) thin films are closely associated with the complex charge dynamics of the materials. Conventional s…