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Feedforward Compensation of Piezo Nonlinearity for High-Precision High-Speed Atomic Force Microscopy
Kenichi Umeda, Noriyuki Kodera
Atomic force microscopy (AFM) enables nanoscale characterization and has been widely applied to a broad range of systems. Over the past two decades, advances in high-speed AFM have…
Guidelines for Fast and Nondestructive Imaging in AM-AFM
Kenichi Umeda, Noriyuki Kodera
Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing…
Excitation frequency dependence of noise and minimum detectable force in amplitude-modulation atomic force microscopy
Kenichi Umeda, Noriyuki Kodera
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising…
Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM
Kenichi Umeda, Karen Kamoshita, Noriyuki Kodera
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials…