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physics.app-ph2024
Guidelines for Fast and Nondestructive Imaging in AM-AFM
Kenichi Umeda, Noriyuki Kodera
Amplitude-modulation atomic force microscopy enables observation of fragile molecules at the nanometer scale. To shorten measurement times and capture dynamic molecules, increasing…
physics.app-ph2024
Excitation frequency dependence of noise and minimum detectable force in amplitude-modulation atomic force microscopy
Kenichi Umeda, Noriyuki Kodera
Atomic force microscopy (AFM) is a versatile nanoscale imaging technique. Since its spatiotemporal resolution is fundamentally limited by the minimum detectable force (MDF) arising…
physics.app-ph2024★ 4 cited
Quantitative Formulation of Frequency-Dependent Average Force in AM-AFM
Kenichi Umeda, Karen Kamoshita, Noriyuki Kodera
Amplitude-modulation atomic force microscopy (AM-AFM) measures nanoscale surface structures by detecting changes in the cantilever oscillation amplitude, contributing to materials…