Uncovering a pressure-tuned electronic transition in BiSrYCu2O8 using Raman scattering and x-ray diffraction

T. Cuk, V. Struzhkin, T. P. Devereaux +5

We report pressure tuned Raman and x-ray diffraction data of Bi1.98Sr2.06Y0.68Cu2O8 revealing a critical pressure at 21 GPa with anomalies in six physical quantities: electronic Ra…