271 citations · 285 across the 2 of their papers we have counts for
2 papers
cond-mat.mtrl-sci2008★ 14 cited
Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films
X. H. Zhu, B. Guigues, E. Defay +1
It was experimentally found that the evolution of dielectric loss with processing temperature displays a common trend in ferroelectric and dielectric thin oxide films: firstly an i…
cond-mat.mtrl-sci2007★ 271 cited
Mechanisms of exchange bias with multiferroic BiFeO3 epitaxial thin films
H. Bea, M. Bibes, F. Ott +7
We have combined neutron scattering and piezoresponse force microscopy to study the relation between the exchange bias observed in CoFeB/BiFeO3 heterostructures and the multiferroi…